1
MICHIGAN ATLAS
CHAMBER
COMMISSIONING
DATABASE
DECEMBER 14, 2004
SHAWN MCKEE, J WEHRLEY CHAPMAN,
TIESHENG DAI, EDWARD DIEHL, CLAUDIO
FERRETTI, DANIEL LEVIN, RUDOLF THUN,
ZHENGGUO ZHAO AND BING ZHOU
D
EPARTMENT OF PHYSICS
U
NIVERSITY OF MICHIGAN
A
NN ARBOR, MICHIGAN 48109
2
THE UNIVERSITY OF MICHIGAN CHAMBER COMMISSIONING
DATABASE
T
ABLE OF CONTENTS
1.
ABSTRACT ......................................................................................................................................... 4
2.
INTRODUCTION ............................................................................................................................... 4
3.
OUTLINE OF PAPER ........................................................................................................................ 5
4.
DATABASE DESIGN PHILOSOPHY.............................................................................................. 5
5.
COMMISSIONING CHAMBER COMPONENTS AND TESTS................................................... 6
6.
UM DATABASE IMPLEMENTATION OVERVIEW ................................................................... 9
6.1
DATA INPUT................................................................................................................................... 9
6.2
WEB INTERFACE .......................................................................................................................... 10
7.
PLANNED FUTURE EXPLORATIONS........................................................................................ 10
8.
FIGURES ........................................................................................................................................... 10
9.
REFERENCES .................................................................................................................................. 30
10.
APPENDICES ............................................................................................................................... 31
10.1
SHORT DESCRIPTION OF THE ELECTRONICS TESTS ...................................................... 31
10.1.1
Pretest HV Off.................................................................................................................... 31
10.1.2
Noise Test HV Off (“Bkg” type “off” station) ................................................................... 31
10.1.3
Threshold Scan (“Thr” station) ......................................................................................... 32
10.1.4
Injection Scan (“Inj” station)............................................................................................. 33
10.1.5
Linearity Scan (“Lin” station) ........................................................................................... 33
10.1.6
Gain Scan (“Gain” station) ............................................................................................... 34
10.1.7
Electronic Tests HV On...................................................................................................... 35
10.1.8
Pretest HV On .................................................................................................................... 35
10.1.9
Noise Run HV On (“Bkg” station type “on”) .................................................................... 35
10.1.10
Extra Noise Run HV On (“Bkg” station type “cr50”)....................................................... 35
10.1.11
Cosmic Ray Run (“CR” station) ........................................................................................ 36
10.2
SUMMARY AND STRUCTURE OF THE COMMISSIONING DATABASE ......................................... 37
10.2.1
Tables for Electronic Noise Runs (“Bkg station”)............................................................. 37
10.2.2
Tables for Harvard ASD DB Data (“BMC” station) ......................................................... 38
10.2.3
Tables for Cosmic Ray Data (“CR” station) ..................................................................... 39
10.2.4
Tables for Electronics Gain scan Data (“Gain” station) .................................................. 41
10.2.5
Tables for ELectronics Injection Scan Data (“Inj” station) .............................................. 42
10.2.6
Tables for Electronics Linearity scan Data (“Lin” station) .............................................. 42
10.2.7
Tables for Mezzanine Card Noise Scan Data (“Mezz” station)........................................ 43
10.2.8
Tables for Mezzanine Card Serial Numbers (“MezzSN” station)...................................... 44
10.2.9
Tables for Electronics Parts Serial Numbers (“SN” station) ............................................ 44
3
10.2.10
Tables for Threshold Scan Data (“Thr” station) ............................................................... 45
10.2.11
Tables for B sensor Serial numbers (“Bsensor” station)................................................... 46
10.2.12
Tables for Chamber Dark Current Data (“ChDC” station).............................................. 46
10.2.13
Tables for Chamber Leak Data (“ChLeak” station).......................................................... 47
10.2.14
Tables for HV Hedgehog Card Serial Numbers (“HVHH” station).................................. 48
10.2.15
Tables for Chamber Parts Installation Data (“Parts” station) ......................................... 48
10.2.16
Tables for Signal Hedgehog Card Serial Numbers (“ROHH” station) ............................. 49
10.2.17
Tables for Chamber Survey Target Data (“survey” station) ............................................. 49
10.2.18
Tables for Chamber Traveler Data (“Traveler” station)................................................... 50
10.2.19
Tables for Temperature Sensor ID Numbers (“Tsensor” station) ..................................... 51
10.2.20
Tables for Inplane Rasnik Granite Table Measurements (“Inplane” station) .................. 51
10.2.21
Tables for PMO Mount ID numbers (“PMOmnt” station) ................................................ 52
10.3
APPENDIX 3: EXAMPLES OF “STATION” TEXT FILES............................................................... 53
10.3.1
Noise Run HV (“Bkg” Station) .......................................................................................... 53
10.3.2
Harvard ASD DB Data (“BMC” station) .......................................................................... 53
10.3.3
Final CosmicRay Test (“CR” station) .............................................................................. 54
10.3.4
Injection Scan (‘Inj” station) ............................................................................................. 55
10.3.5
Linearity Scan (“Lin” station) ........................................................................................... 55
10.3.6
Mezzanine Card Serial Numbers (“MezzSN” station) ....................................................... 55
10.3.7
Offset Correlation (“Mezz” station) .................................................................................. 55
10.3.8
Chamber Electronics Serial Numbers (“SN” station)........................................................ 56
10.3.9
Threshold Scan (”Thr” station) ........................................................................................ 56
10.3.10
B Sensors ID file (“Bsensor” station)................................................................................ 56
10.3.11
Dark Current (“ChDC” station)........................................................................................ 57
10.3.12
Chamber Leak Test (“ChLeak” station) ............................................................................ 57
10.3.13
High Voltage Hedgehog Cards Station (“HVHH” station) ............................................... 57
10.3.14
Signal Hedgehog Cards Station (“ROHH” station) .......................................................... 57
10.3.15
Survey Target Station File (“Survey” station)................................................................... 58
10.3.16
Parts File (“Parts” station) ............................................................................................... 58
10.3.17
Chamber Traveler (“Traveler” station)............................................................................. 58
10.3.18
Temperature Sensor (“Tsensor” station)........................................................................... 59
10.3.19
Inplane Granite/Gradient Measurement (“Inplane” station) ............................................ 59
10.3.20
PMO Mask Mount Station (‘PMOmnt’ station) ................................................................. 59
10.4
APPENDIX 3: TABLES FOR MAPPING TUBE ID TO ELECTRONICS CHANNEL......................... 60
11.
TABLE INDEX ............................................................................................................................. 68
12.
FIGURE INDEX............................................................................................................................ 68
ATTACHMENT: CHAMBER CHECKLIST “TRAVELLER”............................................................ 68
4
THE UNIVERSITY OF MICHIGAN
ATLAS CHAMBER
COMMISSIONING DATABASE
1.
ABSTRACT
We describe herein the design philosophy and the implementation details of the University of
Michigan ATLAS Phase I Chamber Commissioning Database. Details are given that would be useful
to other institutes wishing to establish a similar facility or for use as a design basis for other chamber
commissioning.
2.
INTRODUCTION
Over the next few years the ATLAS Collaboration will need to test, and commission a massive high
precision muon spectrometer consisting of more than one million readout channels. The proper
performance of this instrument is absolutely critical to the success of the experiment, particularly
since one of the key physics goals is the detection of the Higgs boson, and the fourmuon decay is
expected to be one of the principal discovery modes.
After the base MDT chamber construction, the University of Michigan has moved to the next phase
of the muon detector work: commissioning and testing the muon chambers. Michigan chambers
consist of some of the longest drift tubes used in the experiment and are subject to a unique variety
of design, production and commissioning challenges.
The success of the chamber precommissioning (so called phase I commissioning prior to detector
installation) will depend critically on the creation and maintenance of a comprehensive database that
is to contain the relevant evolutionary history and characterization of each muon chamber
component and test.
There are a number of components to be installed on chamber and tests to be run during chamber
commissioning. We will provide details of the tracked components and tests in section 5 of this
paper. In addition we have designed a “Chamber Checklist” which is intended to be stored with
each chamber and updated as the chamber progresses thru commissioning and testing. The detailed
checklist is provided as Attachment I. The structure of our commissioning database reflects the steps
followed in the commissioning and testing of the chambers.
We present herein the philosophy that guided us in the development of this database, and reference
the repository of code that may be required as upgrades are made to the package in the years ahead.
There are several novel elements in our approach. One is a rather close linkage between our
ACCESS database and PAW
(a CERN analysis package)
, designed to facilitate extensive analysis of the
chamber data in an environment that is familiar to a large number of the Project’s physicists. Another
is the use of a tandem database structure where appropriate subsets of the final local data is routinely
captured and made available to other ATLAS databases. Indeed, this arrangement will permit
ongoing upgrades to the main local database, while yet providing a stable feed to the other databases.
An additional unique feature is the provision we have made to insure that the essential functions of
the database are accessible remotely via the web.
Other details will be described herein that we hope will be of value to other institutes as they design
and deploy their databases.
5
3.
OUTLINE OF PAPER
In Section 4 we discuss the guiding principles we used in establishing our database. The details of the
commissioning components and tests are described in Section 5, including tables of recorded
quantities. In Section 6 we provide an overview of the database implementation. Section 7
concludes with a view about possible future work.
Section 8 is a set of figures detailing important information for chamber commissioning. Section 9
includes all references. Section 10 are a set of appendices showing detailed information about the
database, input file formats and tube to electronics channel mappings. The paper concludes with an
attachment of our “Chamber Traveler” showing the details recorded on paper and stored with each
chamber.
4.
DATABASE DESIGN PHILOSOPHY
There are several basic principles we have tried to adhere to as the database structure was established.
Many of these will, at first, appear to be obvious. But, even a significant fraction of these are subject
to a reasonable debate.
To give just one example, in this day and age of fast computers and cheap data storage cost, one
might think it reasonable to measure and record each and every conceivable bit of information about
every component that goes into the muon chambers. After all, it may be argued, we may wish to have
access to a particular data element five years from now, even though we see no use for it now. The
competing argument is that if we are not careful we will drown in useless information and will be led
into a false state of believing we can accept wide variances in chamber parameters now, since we
presumably could correct for most maladies in the future. Even worse, the added burden of
generating and recording data which may never be used could cause us to fail to meet our schedule
or drive our costs over budget.
Against this background, we have decided to adopt the following set of guidelines:
„
We will collect and store every piece of data that is known to bear directly on
the principal physics performance of the muon chamber
„
We will collect and store chamber
commissioning data related to the addon
components, commissioning conditions and commissioning test/verification
procedures, including all information required by the ATLASwide muon
coordinating groups like the MFT and Integration database groups.
„
We will automate each and every measurement possible. Each manual entry of a
measured quantity to our database
must be justified and approved for each case.
„
The database is to be available to any authorized user via the web. That is, key
members of the ATLAS Muon group should be able to log on to the web
anywhere in the world and, after sufficient authorization checks, have the same
functionality as if he or she was in the commissioning lab.
„
Database backup should occur regularly, via replication, explicit backup to tape
or disk and storage on RAID enabled system storage.
„
The initial database application backend will be based upon Microsoft ACCESS.
„
An ACCESS database, or whatever other application is specified by ATLAS,
will be explicitly maintained to provide an interface to the ATLAS wide global
databases.
6
5.
COMMISSIONING CHAMBER COMPONENTS AND TESTS
The information we need to record for commissioning is critical to correctly identify each single
component. Too much information will cause needless work, possible delays and/or cost overruns,
while too little information risks missing recording potentially vital information needed during the
systems operation or data analysis.
We have identified a number of components and tests from which we will gather selected
information for storage in the database. While other components will be installed (Cables, Safety
Brackets, AMB, etc.) we don’t have any need to record their details. The list of components we will
track during chamber commissioning includes:
„
Survey Targets
„
B Sensors
„
PMO Mask Mounts
„
Gasbar Extension Tube Types
„
Tubelet Types
„
HV Hedgehog Cards
„
Signal Hedgehog Cards
„
Mezzanine Cards
„
CSM Motherboard
„
CSM Daughterboard
„
DCS Box
The corresponding measurements and tests include:
„
Multilayer gas leak rate
„
Tube layer dark current rate
„
MECCA test
„
Inplane alignment measurements on granite table (copy from chamber production)
„
Inplane gradient measurements (copy from base chamber production)
„
Mezzanine card threshold scan
„
Mezzanine card linearity scan
„
Mezzanine card gain scan
„
Temperature sensor test (readout values and IDs)
„
Final cosmicray testing of full chamber
The following tables list the information we intend to record for each component or measurement.
Implicit in each item is recording the Chamber ID barcode which gives the chamber mechanical ID,
e.g., EML5C08.
Table 1: Chamber Commissioning Components
Item
Number
Units and Details
Recording
Method
Survey
Targets
8
Locations are given in Brandeis chamber drawings (see Figure 5
Figure 14 on pages 1424). There are 8 numbered positions
which are the same for all chamber types. These positions are 5,
6, 7, 8, 9, 10, 11, and 12. So the data file will be a list of these 8
location numbers followed by the survey target ID at each
location.
Typed into
program
7
Item
Number
Units and Details
Recording
Method
B Sensors
0, 2 , 4
Locations are given in Brandeis chamber drawings (see Figure 5
Figure 14 on pages 1424). There are 0, 2, or 4 numbered
positions depending on chamber type. Here are the locations used
by each chamber type.
EML4, EML5
:
no B sensors
;
EML3,
EMS5
:
13, 14
;
EMS4
:
13, 14, 15, 16
Read by DCS
Software
T Sensors
5
On the Michigan chambers there are 5 T sensor "strings", each of
which has 4 T sensors, for a total of 20 T sensors per chamber.
Each string has an ID number. The 4 T sensors per string are
uniquely addressable, so only one ID number is required per
string. Each string number is installed / cabled in a unique
position on the chamber according to diagrams provided by UW.
See Figure 19 and igure 20. The temperature sensors are tested
during chamber commissioning but the temperatures are not
recorded since they have no longterm use.
Typed into
program
PMO
Mask
Mount
1 or 2
Locations are given in Brandeis chamber drawings (see Figure 5
Figure 14 on pages 1424). There are 1 or 2 numbered positions
depending on chamber type. The numbers change for A and C
type chambers. Here is the list of location numbers:
EMS A
type
:
2, 3
;
EMS C type
:
1, 4
;
EML A type
:
3
;
EML C type
:
4
Typed into
program
ET Type
3 Record ET type (Brandeis, Seattle 1 or 2) for each Multilayer
Typed into
program
Tubelet
Type
3 Possible types: HIEM hard brass, ATB stainless, HIEM soft brass
Typed into
program
HV
Hedgehog
Cards
1218
The DB files will list the ID numbers by positions starting from 0
(UM chambers have 16 HV HH cards, all type I or II) which are
shown on figures M and N. Chambers on sides A and C use the
same numbering, though the physical positions differ for A and C
chambers (see Figure 15 and Figure 16 on pages 2525).
Typed into
program
Signal
Hedgehog
Cards
1218
The DB files will list the ID numbers by positions starting from 0
(UM chambers have 16 Signal HH cards, all type I or II) which
are shown on figures M and N. Chambers on sides A and C use
the same numbering, though the physical positions differ for A
and C chambers (see Figure 15 and Figure 16 on pages 2525).
Typed into
program
Mezzanine
Cards
1218
The DB files will list the ID numbers by positions starting from 0
(UM chambers have 16 mezzanine cards) which are shown on
figures M and N. Chambers on sides A and C use the same
numbering, though the physical positions differ for A and C
chambers (see Figure 15 and Figure 16 on pages 2525).
Extracted from
other tests
CSM MB
1 The CSM motherboard has a barcode with its ID
Extracted from
tests (
Table 2
)
CSM DB
1 The CSM daughterboard has a barcode with its ID
Extracted from
tests (
Table 2
)
DCS
1
The DCS box has a barcode with its ID, must also record serial
#.
Extracted from
tests(
Table 2
)
The set of commissioning measurements and tests is given in the following table
Table 2: Chamber Commissioning Tests and
8
Measurements
Item
Number
Units and Details
Recording
Method
Chamber Leak
Rate
6 (Each ML:
initial, long term
and final)
Millibar/day per ML and barl/s per tube. We
also record relevant details (duration,
environment conditions, etc.)
Leak station
software
Dark current
@3.4kV
6 (1 per layer) MicroAmps. We also record relevant details (HV,
gas, humidity)
Typed into
program
Inplane RASNIK
granite
measurement
4 sets/chamber
x 6 numbers
X gradient, Y gradient, X location (microns), Y
location (microns), Magnification (no unit), and
Tilt (milliradiant). The inplane X and Y axes
correspond to the chamber Z and Y axes,
respectively (see Figure
2
pag.11). Conversion to
the chamber coordinate system is done by
multiplying the RASNIK X or Y value by the X
or Y gradient. The gradients give the sign of the
change of the RASNIK value when the center
crossbeam is moved in the positve Z or Y
direction (chamber coordinate direction).
Measured
during base
chamber
construction by
Rasnik software
Electronics Serial
Numbers
22 codes Each chamber set of electronics components is
indicated by a unique ID: chamber name, serial
number and ID, Motherboard serial number,
DCS node, ID and barcode, mezzanine cards
Scanned and/or
manually input
when mounted
on chamber
Mezzanine DB
Mezzanine cards
parameters (15
number/card)
Copy of the most relevant mezzanine and ASD
parameters measured during Harvard’s tests, used
in all electronic tests.
From BMC
database
Threshold scan
Fit offset per
channel (8
number/chan)
Each mezzanine card will have its thresholds
scanned for each channel. Serial numbers for
mezzanines cards are recorded as well.
Tests with and without HV on.
Measured by
electronics
DAQ software
Injection scan
Injection
efficiency and
crosstalk per
channel (5
number/chan)
Each channel has test pulses injected and the
channels efficiency and crosstalk measured.
Tests are performed with and without HV on.
Measured by
electronics
DAQ software
Linearity scan
Timing linearity
per channel (10
number/chan)
Each channel is measured with 19 different
timing delays to determine linearity. Fit results
(slope, intercept, error) recorded to DB.
Tests with and without HV on.
Measured by
electronics
DAQ software
Gain scan
ADC gain per
channel (13
number/chan)
Each channel has varying amounts of charge
injected and gain measured. Fits results recorded
to DB. Tests with and without HV on.
Measured by
electronics
DAQ software
Noise run
Noise levels for
each channel (6
number/chan +
DAQ settings)
Random trigger runs to measure the noise rates at
high effective threshold for each channel.
Tests are performed with and without HV on.
Measured by
electronics
DAQ software
9
Final cosmicray
test
Chamber and
single tube
physical
parameters (33
numbers +16
number/chan
+DAQ settings)
Each tube will have the following set of numbers
measured: relative efficiency, T0, T0rise, Tmax,
Tmax Fall, Drift Time, Noise below T0, Noise
above Tmax, noise ASD, number of hits, ADC
parameters, Fit errors and chisquared value for
each fit parameter.
Measured by
cosmicray test
software. Runs
will be 1215 h
long (enough to
acquire ~20K
events per tube)
Special note on the Inplane RASNIK System
: The inplane RASNIK system is an optical position
measuring system consisting of a RASNIK mask, a lens, and a CCD camera. The lenses are mounted
on the center crossbeam, and the mask and CCD are mounted on opposite end crossbeams
.
The
system monitors the relative positions of the CCD, lens, and mask. The DB has the measurements of
the inplane system when the chamber was on the granite assembly table and presumed to be
perfected aligned with no distortions. When the chamber is removed from the granite it will distort,
and by comparing inplane measurements taken off the granite with those taken on the granite, one
may determine the chamber distortions the directions perpendicular to the inplane RASNIK lines.
The RASNIK mask has encoded in it an XY coordinate system. The RASNIK X and Y
measurements refer to the coordinates system used by the Brandeis RASNIK image analysis
program. The mask is positioned so that the RASNIK X coordinate corresponds to the chamber Z
coordinate, and the RASNIK Y corresponds to the chamber Y coordinate, with the exception of a