Report

1. ABSTRACT
WE DESCRIBE HEREIN THE DESIGN PHILOSOPHY AND THE IMPLEMENTATION DETAILS OF THE UNIVERSITY OF MICHIGAN ATLAS PHASE I CHAMBER COMMISSIONING DATABASE. DETAILS ARE GIVEN THAT WOULD BE USEFUL TO OTHER INSTITUTES WISHING TO ESTABLISH A SIMILAR FACILITY OR FOR USE AS A DESIGN BASIS FOR OTHER CHAMBER COMMISSIONING.
2. INTRODUCTION
OVER THE NEXT FEW YEARS THE ATLAS COLLABORATION WILL NEED TO TEST, AND COMMISSION A MASSIVE HIGH PRECISION MUON SPECTROMETER CONSISTING OF MORE THAN ONE MILLION READOUT CHANNELS. THE PROPER PERFORMANCE OF THIS INSTRUMENT IS ABSOLUTELY CRITICAL TO THE SUCCESS OF THE EXPERIMENT, PARTICULARLY SINCE ONE OF THE KEY PHYSICS GOALS IS THE DETECTION OF THE HIGGS BOSON, AND THE FOUR-MUON DECAY IS EXPECTED TO BE ONE OF THE PRINCIPAL DISCOVERY MODES.
AFTER THE BASE MDT CHAMBER CONSTRUCTION, THE UNIVERSITY OF MICHIGAN HAS MOVED TO THE NEXT PHASE OF THE MUON DETECTOR WORK: COMMISSIONING AND TESTING THE MUON CHAMBERS. MICHIGAN CHAMBERS CONSIST OF SOME OF THE LONGEST DRIFT TUBES USED IN THE EXPERIMENT AND ARE SUBJECT TO A UNIQUE VARIETY OF DESIGN, PRODUCTION AND COMMISSIONING CHALLENGES.
THE SUCCESS OF THE CHAMBER PRE-COMMISSIONING (SO CALLED PHASE I COMMISSIONING PRIOR TO DETECTOR INSTALLATION) WILL DEPEND CRITICALLY ON THE CREATION AND MAINTENANCE OF A COMPREHENSIVE DATABASE THAT IS TO CONTAIN THE RELEVANT EVOLUTIONARY HISTORY AND CHARACTERIZATION OF EACH MUON CHAMBER COMPONENT AND TEST.
THERE ARE A NUMBER OF COMPONENTS TO BE INSTALLED ON CHAMBER AND TESTS TO BE RUN DURING CHAMBER COMMISSIONING. WE WILL PROVIDE DETAILS OF THE TRACKED COMPONENTS AND TESTS IN SECTION 5 OF THIS PAPER. IN ADDITION WE HAVE DESIGNED A “CHAMBER CHECKLIST” WHICH IS INTENDED TO BE STORED WITH EACH CHAMBER AND UPDATED AS THE CHAMBER PROGRESSES THRU COMMISSIONING AND TESTING. THE DETAILED CHECKLIST IS PROVIDED AS ATTACHMENT I. THE STRUCTURE OF OUR COMMISSIONING DATABASE REFLECTS THE STEPS FOLLOWED IN THE COMMISSIONING AND TESTING OF THE CHAMBERS.
WE PRESENT HEREIN THE PHILOSOPHY THAT GUIDED US IN THE DEVELOPMENT OF THIS DATABASE, AND REFERENCE THE REPOSITORY OF CODE THAT MAY BE REQUIRED AS UPGRADES ARE MADE TO THE PACKAGE IN THE YEARS AHEAD.
THERE ARE SEVERAL NOVEL ELEMENTS IN OUR APPROACH. ONE IS A RATHER CLOSE LINKAGE BETWEEN OUR ACCESS DATABASE AND PAW (A CERN ANALYSIS PACKAGE), DESIGNED TO FACILITATE EXTENSIVE ANALYSIS OF THE CHAMBER DATA IN AN ENVIRONMENT THAT IS FAMILIAR TO A LARGE NUMBER OF THE PROJECT’S PHYSICISTS. ANOTHER IS THE USE OF A TANDEM DATABASE STRUCTURE WHERE APPROPRIATE SUBSETS OF THE FINAL LOCAL DATA IS ROUTINELY CAPTURED AND MADE AVAILABLE TO OTHER ATLAS DATABASES. INDEED, THIS ARRANGEMENT WILL PERMIT ONGOING UPGRADES TO THE MAIN LOCAL DATABASE, WHILE YET PROVIDING A STABLE FEED TO THE OTHER DATABASES. AN ADDITIONAL UNIQUE FEATURE IS THE PROVISION WE HAVE MADE TO INSURE THAT THE ESSENTIAL FUNCTIONS OF THE DATABASE ARE ACCESSIBLE REMOTELY VIA THE WEB.
OTHER DETAILS WILL BE DESCRIBED HEREIN THAT WE HOPE WILL BE OF VALUE TO OTHER INSTITUTES AS THEY DESIGN AND DEPLOY THEIR DATABASES.
3. OUTLINE OF PAPER
IN SECTION 4 WE DISCUSS THE GUIDING PRINCIPLES WE USED IN ESTABLISHING OUR DATABASE. THE DETAILS OF THE COMMISSIONING COMPONENTS AND TESTS ARE DESCRIBED IN SECTION 5, INCLUDING TABLES OF RECORDED QUANTITIES. IN SECTION 6 WE PROVIDE AN OVERVIEW OF THE DATABASE IMPLEMENTATION. SECTION 7 CONCLUDES WITH A VIEW ABOUT POSSIBLE FUTURE WORK.
SECTION 8 IS A SET OF FIGURES DETAILING IMPORTANT INFORMATION FOR CHAMBER COMMISSIONING. SECTION 9 INCLUDES ALL REFERENCES. SECTION 10 ARE A SET OF APPENDICES SHOWING DETAILED INFORMATION ABOUT THE DATABASE, INPUT FILE FORMATS AND TUBE TO ELECTRONICS CHANNEL MAPPINGS. THE PAPER CONCLUDES WITH AN ATTACHMENT OF OUR “CHAMBER TRAVELER” SHOWING THE DETAILS RECORDED ON PAPER AND STORED WITH EACH CHAMBER.
4. DATABASE DESIGN PHILOSOPHY
THERE ARE SEVERAL BASIC PRINCIPLES WE HAVE TRIED TO ADHERE TO AS THE DATABASE STRUCTURE WAS ESTABLISHED. MANY OF THESE WILL, AT FIRST, APPEAR TO BE OBVIOUS. BUT, EVEN A SIGNIFICANT FRACTION OF THESE ARE SUBJECT TO A REASONABLE DEBATE.
TO GIVE JUST ONE EXAMPLE, IN THIS DAY AND AGE OF FAST COMPUTERS AND CHEAP DATA STORAGE COST, ONE MIGHT THINK IT REASONABLE TO MEASURE AND RECORD EACH AND EVERY CONCEIVABLE BIT OF INFORMATION ABOUT EVERY COMPONENT THAT GOES INTO THE MUON CHAMBERS. AFTER ALL, IT MAY BE ARGUED, WE MAY WISH TO HAVE ACCESS TO A PARTICULAR DATA ELEMENT FIVE YEARS FROM NOW, EVEN THOUGH WE SEE NO USE FOR IT NOW. THE COMPETING ARGUMENT IS THAT IF WE ARE NOT CAREFUL WE WILL DROWN IN USELESS INFORMATION AND WILL BE LED INTO A FALSE STATE OF BELIEVING WE CAN ACCEPT WIDE VARIANCES IN CHAMBER PARAMETERS NOW, SINCE WE PRESUMABLY COULD CORRECT FOR MOST MALADIES IN THE FUTURE. EVEN WORSE, THE ADDED BURDEN OF GENERATING AND RECORDING DATA WHICH MAY NEVER BE USED COULD CAUSE US TO FAIL TO MEET OUR SCHEDULE OR DRIVE OUR COSTS OVER BUDGET.
AGAINST THIS BACKGROUND, WE HAVE DECIDED TO ADOPT THE FOLLOWING SET OF GUIDELINES:
5. COMMISSIONING CHAMBER COMPONENTS AND TESTS
THE INFORMATION WE NEED TO RECORD FOR COMMISSIONING IS CRITICAL TO CORRECTLY IDENTIFY EACH SINGLE COMPONENT. TOO MUCH INFORMATION WILL CAUSE NEEDLESS WORK, POSSIBLE DELAYS AND/OR COST OVERRUNS, WHILE TOO LITTLE INFORMATION RISKS MISSING RECORDING POTENTIALLY VITAL INFORMATION NEEDED DURING THE SYSTEMS OPERATION OR DATA ANALYSIS.
WE HAVE IDENTIFIED A NUMBER OF COMPONENTS AND TESTS FROM WHICH WE WILL GATHER SELECTED INFORMATION FOR STORAGE IN THE DATABASE. WHILE OTHER COMPONENTS WILL BE INSTALLED (CABLES, SAFETY BRACKETS, AMB, ETC.) WE DON’T HAVE ANY NEED TO RECORD THEIR DETAILS. THE LIST OF COMPONENTS WE WILL TRACK DURING CHAMBER COMMISSIONING INCLUDES:
6. UM DATABASE IMPLEMENTATION OVERVIEW
1. 6.1 DATA INPUT
2. THE LIST OF PERMANENT TABLES AND FIELDS COMPRISING OUR PRODUCTION DATABASE ARE GIVEN IN APPENDIX 1. DATA ARE INSERTED INTO THE DATABASE EITHER MANUALLY OR THROUGH A QUASI-AUTOMATIC PROCESS WHERE DATA STATIONS OUTPUT RESULTS OF THEIR MEASUREMENTS TO STRUCTURED TEXT FILES [SEE “UM DAQ SYSTEM FOR MDT PRODUCTION” BY QICHUN AND ZHOU, SUBMITTED AS AN ATLAS NOTE]. THESE TEXT FILES ARE THEN LOADED INTO THE DATABASE THROUGH EXPRESS ACTIONS OF THE DATABASE MANAGER (OR A MONITORING PACKAGE, WHICH HE OR SHE CONTROLS). IN THE LATTER STEP ONE HAS THE OPTION OF NOT ONLY COORDINATING THE DAILY UPDATES, BUT OF ALSO EXECUTING CERTAIN CONSISTENCY CHECKS BEFORE THE UPLOADING TAKES PLACE.
3. 6.2 WEB INTERFACE
4. GIVEN THE DISTRIBUTED NATURE OF OUR PRODUCTION AND TESTING FACILITY, AS WELL AS THE FACT THAT KEY INDIVIDUALS IN OUR GROUP MUST BE ABLE TO QUERY THE STATUS OF THE FABRICATION AT ANY TIME AND FROM ANY PLACE IN THE WORLD, WE HAVE GIVEN HIGH PRIORITY TO PROVIDING FULL DATABASE ACCESS AND CONTROL TO AUTHENTICATED USERS VIA THE WEB.
5. THE ENTIRE INTERFACE WITH THE DATABASE WILL, OF COURSE, APPEAR DIFFERENTLY FROM THE DIRECT HOST-BASED INTERFACE DESCRIBED HERE. ONE REASON HAS TO DO WITH SECURITY CONSIDERATIONS. ANOTHER TECHNICAL REASON IS THAT THE WEB USER IS REALLY NOT RUNNING ACCESS ON THE HOST MACHINE, BUT RATHER IS BEING PROVIDED WITH VARIOUS PUBLISHED SERVICES. WE HAVE PROVIDED MORE DETAILS ABOUT HOW THE FEATURES OF THE WEB INTERFACE IN A PREVIOUS ATLAS NOTE ON OUR PRODUCTION DATABASE (SEE REFERENCE 1)).
7. PLANNED FUTURE EXPLORATIONS
WE PLAN TO SUPPORT FUTURE DEVELOPMENT BASED UPON FEEDBACK FROM CHAMBER COMMISSIONERS.
8. FIGURES
9. REFERENCES
10. APPENDICES
1. 10.1 SHORT DESCRIPTION OF THE ELECTRONICS TESTS
2. MDT CHAMBER ELECTRONICS TESTS ARE DONE BOTH WITH CHAMBER HV OFF, TO IDENTIFY ANY PROBLEMS DUE TO MEZZANINE CARDS, AND WITH CHAMBER HV ON, TO DISCOVER PROBLEMS DUE TO THE MDT CHAMBER. FOR A DESCRIPTION OF HOW TO RUN THE TESTS USING THE MINIDAQ PROGRAM AND RELATED CHAMBER DATA ANALYSIS SEE THE WEB PAGE: HTTP://CDFRH0.GRID.UMICH.EDU/~CLAUDIOF/ATLAS/B184/CERNTEST.HTML
3. THE DESCRIPTIONS OF THE ELECTRONICS TESTS WILL OFTEN REFER TO THE FOLLOWING QUANTITIES:
4. 1) V OFFSET SPAN: ABSOLUTE VALUE OF MAXIMUM DIFFERENCE OF OFFSETS AS MEASURED BY HARVARD IN THE SINGLE ASD CHIP TEST (ASD DATABASE)
5. 2) EFFECTIVE THRESHOLD: NOMINAL ASD THRESHOLD - HYSTERESIS + CORRECTION FROM ASD V-OFFSETS WHERE THE CORRECTION FROM ASD IS DONE AS:
6. 2) 0.5 * (MIN V OFFSET + MAX V OFFSET) (V OFFSET SPAN < 12MV)
7. 2) 0.5 * (MIN V OFFSET + MAX V OFFSET) – 2 MV (V OFFSET SPAN 12MV TO 14MV)
8. 2) 0.5 * (MIN V OFFSET + MAX V OFFSET) – 4 MV (V OFFSET SPAN 14MV TO 16MV)
9. 3) ASD NOISE: HITS WITH A CHARGE WIDTH BELOW A CUT VALUE SET BETWEEN 30 AND 40 NS DEPENDING ON THE DAQ PARAMETERS. THIS NOISE IS ALSO REFERRED TO AS "ELECTRONICS NOISE" SINCE IT GENERALLY COMES FROM THE MEZZANINE CARDS AND E.M.I. PICKUP.
10. 4) TUBE NOISE: THE NOISE REMAINING AFTER SUBTRACTING THE ASD NOISE, MAINLY RELATED TO THE TUBE, HV HEDGEHOG CARD AND SIGNAL HEDGEHOG CARD.
11. PRETEST HV OFF
12. THE MDT ELECTRONICS TESTS WITH CHAMBER HV OFF START WITH A DAQ HARDWARE CHECK. THIS STEP TYPICALLY REQUIRES A TOTAL TIME OF 10 MINUTES. THE MAIN PURPOSE IS TO INSURE DAQ SYSTEM FUNCTIONALITY AND TO CHECK FOR VALID MEZZANINE CARD IDS. AN ERROR MESSAGE IS ISSUED FOR ANY OF THE FOLLOWING CONDITIONS:
13. 1) UNABLE TO FIND OR OPEN THE MEZZANINE CARD DATABASE FILE;
14. 2) UNABLE TO FIND A MEZZANINE CARD IN THE MEZZANINE CARD DATABASE;
15. 3) AN ASD THRESHOLD OFFSET SPAN IS LARGER THAN 16.0 MV.
16. NOISE TEST HV OFF (“BKG” TYPE “OFF” STATION)
17. THE FIRST CHAMBER TEST IS A NOISE TEST. THIS TEST CHECKS THAT THE MDT CHAMBER ELECTRONICS ARE NOT NOISY WITH HV OFF AND IDENTIFIES ANY MEZZANINE CARDS WITH A HIGH ASD NOISE LEVEL.
18. THE TRIGGER USED IS THE TTCVI RANDOM TRIGGER AT 5 KHZ (THE USUAL MEASURED DAQ RATE IS 9.2 KHZ WITH TTCVI MARK II). THE (RECOMMENDED) DAQ TIME FOR THIS RUN IS 20 MINUTES (TYPICAL TOTAL TEST TIME IS 22 MINUTES, INCLUDING INITIALIZATION), WITH AN EFFECTIVE THRESHOLD -50MV AND A (RECOMMENDED) ASD HYSTERESIS OF 8.75 MV. FROM THIS NOISE RUN BOTH ASD AND TUBE NOISE RATES ARE MEASURED. THE REQUIREMENT IS THAT FOR EACH CHANNEL/TUBE THE ASD NOISE RATE < 5KHZ AND A WARNING IS ISSUED FOR ASD/TUBE NOISE > 5 KHZ AND A SIMPLE INFO FOR > 2KHZ.
19. RECORDED QUANTITIES (FOR EACH CHANNEL):
20. 1) MEZZANINE CARD NUMBER AND CHANNEL NUMBER (UNIQUE ELECTRONIC ADDRESS OF EACH TUBE)
21. 2) ROW NUMBER (FROM 1 TO 6/8, COUNTED FROM THE PMO SIDE) AND TUBE NUMBER (TO ADDRESS EACH TUBE AS PHYSICAL LOCATION)
22. 3) NUMBER OF LARGE WIDTH HITS,
23. 4) ASD NOISE AND THE NON-ASD (TUBE) NOISE RATE IN KHZ.
24. THRESHOLD SCAN (“THR” STATION)
25. THE SECOND TEST IS A THRESHOLD SCAN. THIS IS TO INSURE THAT RECORDED MEZZANINE CARD IDS ARE CORRECT FOR EACH LOCATION BY COMPARING THE MEASURED V OFFSETS WITH HARVARD MEZZANINE CARD/ASD DATABASE SINCE THE 24 CHANNELS V OFFSETS FROM A CARD ARE LIKE A FINGERPRINT OF THE BOARD. IT ALSO IDENTIFIES ANY DEAD CHANNELS IN THE CARD.
26. ASSUMING THERE IS PREDOMINANTLY THERMAL NOISE (GENERALLY THE TUBE RESISTANCE IS THE DOMINATE NOISE SOURCE AND THIS IS A VALID ASSUMPTION), THE NOISE OF EACH CHANNEL OF AN ASD CHIP IS A THRESHOLD DEPENDENT GAUSSIAN DISTRIBUTION:
27. ASDNOISERATE = R0 * EXP[-(V-VOFFSET)**2/(2.0*SIGMA**2)]
28. WHERE
29. · R0 IS THE MAXIMUM ASD NOISE RATE (TYPICAL VALUE 20MHZ);
30. · V IS THE ASD THRESHOLD AND VOFFSET IS THE THRESHOLD OFFSET;
31. · SIGMA IS THE GAUSSIAN WIDTH OF ASD NOISE DISTRIBUTION.
32. THIS TEST MEASURES THE NOISE AT DIFFERENT THRESHOLD AND THE MEASURED RESULTS ARE FITTED TO A GAUSSIAN DISTRIBUTION TO OBTAIN V OFFSET. THE ASD NOISE RATE CAN REACH 20MHZ WHICH IS FAR BEYOND THE AMT CHIP READOUT LIMITS (300 KHZ PER CHANNEL), SO ONLY THE TAILS FROM THE GAUSSIAN ARE USED FOR THE FIT.
33. NOTE: LARGE NOISE NOT DUE TO MEZZANINE CARDS (SUCH AS FROM THE MDT CHAMBER) COULD SPOIL THE V OFFSET MEASUREMENT, TYPICALLY WITH LARGE CHI2 AND ABNORMAL SIGMA.
34. THE TEST IS STRUCTURED AS 76 RUNS OF 10K EVENTS EACH WITH ASD HYSTERESIS SET TO ZERO, THE ASD CALIBRATION CAPACITOR IS 50FF, THE TRIGGER IS A TTCVI SOFTWARE TRIGGER (GIVING A TYPICAL DAQ RATE OF 2.5KHZ), FOR A TYPICAL TOTAL TEST TIME OF 35 MINUTES. IN ORDER TO MINIMIZE THE INTERFERENCE BETWEEN THE 3 ASDS, THEIR THRESHOLDS ARE ARRANGED SO THAT IF ONE ASD IS AT A LOW THRESHOLD, OTHER TWO HAVE HIGH ONES.
35. RECORDED QUANTITIES:
36. 1) FOR EACH MEZZANINE, THE CARD NUMBER AND THE CHANNEL NUMBER TO ADDRESS EACH SINGLE TUBE;
37. 2) FOR EACH CHANNEL THE NUMBER OF TRIGGERS,
38. 3) NUMBER OF DEGREES FREEDOM (NUMBER OF DATA POINTS - 3 FIT PARAMETERS),
39. 4) CHI SQUARE PER DEGREE OF FREEDOM,
40. 5) THREE GAUSSIAN FITTED PARAMETERS V OFFSET, SIGMA AND LOG(NORMALIZATION) AND THE CORRELATION BETWEEN ON CHAMBER DATA AND THE ASD DATABASE V-OFFSET MEASUREMENT.
41. THE CORRELATION IS GIVEN FOR THE FULL MEZZANINE CARD (ALL 24 CHANNELS READOUT) AND FOR EACH ASD.
42. ALL CORRELATIONS ARE REQUIRED TO BE LARGER THAN 70%.
43. A WARNING MESSAGE IS ISSUED IF:
44. � A MEZZANINE CARD IS NOT FOUND IN THE CARD DATABASE
45. � ANY OF THE PREVIOUSLY DESCRIBED CORRELATION IS LESS THAN 0.7
46. � THE NUMBER OF DEGREES OF FREEDOM OF THE GAUSSIAN FIT IS LESS THAN 0.
47. � V OFFSET COULD NOT BE MEASURED, WHICH HAPPENS FOR DEAD OR EXTREMELY NOISY CHANNEL.
48. AN INFO MESSAGE IS ISSUED IF THE ABSOLUTE VALUE OF V OFFSET IS LARGER THAN 16MV (BAD MEASUREMENT OR POTENTIAL BAD MEZZANINE CARD) OR THE SIGMA FROM THE GAUSSIAN FIT IS LARGER THAN 10 MV.
49. INJECTION SCAN (“INJ” STATION)
50. THE THIRD TEST IS AN INJECTION SCAN TO IDENTIFY LOW EFFICIENCY AND HIGH LEVELS OF CROSSTALK FOR EACH CHANNEL. THE CALIBRATION SIGNAL IS INJECTED INTO A SINGLE CHANNEL OF EACH MEZZANINE CARD SO HITS ARE EXPECTED ONLY IN THE INJECTED CHANNEL. THE CHANNEL EFFICIENCY IS DEFINED AS THE ACTUAL HITS IN THE INJECTED CHANNEL OVER THE NUMBER OF INJECTIONS. THE CHANNEL CROSSTALK IS DEFINED AS THE NUMBER OF ACTUAL HITS IN ALL THE OTHER 23 CHANNELS OF THE SAME CARD DIVIDED BY THE TOTAL NUMBER OF INJECTIONS. OF COURSE, HIGH NOISE RATES CAN SKEW THE CROSSTALK MEASUREMENT SINCE IT IS NOT BASED ON TIME, BUT WE HAVE NOT FOUND THIS TO BE A SIGNIFICANT PROBLEM.
51. THE TEST CONSISTS OF 24 RUNS OF 10K EVENTS EACH, WITH ASD THRESHOLD AT -50MV, ASD HYSTERESIS AT 2.5MV, ASD CALIBRATION CAPACITOR IS 250FF AND TRIGGERED BY THE TTCVI ONE SHOT RANDOM TRIGGER (TYPICAL DAQ RATE 2.5KHZ), FOR A TYPICAL TOTAL TEST TIME OF 11 MINUTES.
52. RECORDED QUANTITIES (FOR EACH CHANNEL):
53. 1) MEZZANINE CARD NUMBER AND CHANNEL NUMBER,
54. 2) NUMBER OF TRIGGERS/INJECTIONS,
55. 3) CHANNEL EFFICIENCY,
56. 4) CHANNEL CROSSTALK.
57. THE SINGLE CHANNEL REQUIREMENT IS TO HAVE EFFICIENCY > 95% AND CROSS-TALK < 20% FOR CHANNEL 0, 8 AND 16, AND < 5% FOR OTHER CHANNELS.
58. A WARNING MESSAGE WILL BE ISSUED IF A CHANNEL IS
59. a) DEAD (EFFICIENCY <= 5%),
60. b) LOW EFFICIENCY (EFFICIENCY IN THE RANGE (5%, 95%]),
61. c) HOT (105% <= EFFICIENCY < 200%),
62. d) VERY HOT (EFFICIENCY>= 200%)
63. e) LARGE CROSS-TALK (>= 20% FOR CHANNEL 0, 8 AND 16, >=0.05 FOR ALL OTHER CHANNELS).
64. LINEARITY SCAN (“LIN” STATION)
65. THE FOURTH TEST IS A LINEARITY SCAN WHICH MEASURES EACH CHANNEL'S INTRINSIC TDC TIME RESOLUTION AND CHECKS FOR GOOD LINEARITY IN TIME MEASUREMENTS. THE CALIBRATION SIGNALS ARE INJECTED AT DIFFERENT TIMES WITH RESPECT TO THE CALIBRATION TRIGGER. THE AVERAGE TDC TIME AND TDC TIME RESOLUTION (CALCULATED BY USING HITS NEAR MAJOR TIME PEAK) ARE OBTAINED AT EACH INJECTION, AND THE MEASURED TDC TIMES ARE FITTED AGAINST THE EXPECTED ONES USING A LINEAR FUNCTION (SLOPE = 1). TYPICALLY INTRINSIC TIME RESOLUTION IS BELOW ONE 0.78125NS COUNT AND LINEARITY IS ||SLOPE| - 1.|<10-4.
66. THIS SCAN IS 19 RUNS OF 10K EVENTS EACH AND USING ASD THRESHOLD AT -50MV, ASD HYSTERSIS AT 2.5MV, THE CHOSEN ASD CALIBRATION CAPACITOR IS 250FF AND THE TRIGGER IS THE TTCVI CALIBRATION TRIGGER WITH TOTAL TEST TIME OF 6 MINUTES.
67. RECORDED QUANTITIES (FOR EACH CHANNEL):
68. � MEZZANINE CARD NUMBER AND CHANNEL NUMBER,
69. � CALIBRATION TRIGGER DELAY (IN CSM 40 MHZ CLOCK TICKS),
70. � MEASURED (AVERAGE) TDC TIME IN COUNTS,
71. � TDC TIME RESOLUTION IN COUNTS,
72. � SLOPE AND THE INTERCEPT OF THE LINEAR FIT,
73. � MEAN SQUARE ERROR,
74. � MINIMUM AND MAXIMUM TDC TIME RESOLUTION IN COUNTS
75. � MINIMUM AND MAXIMUM FRACTION OF USED HITS TO COMPUTE TDC TIME RESOLUTION.
76. � THE REQUIREMENTS FOR THIS TEST ARE:
77. � SINGLE CHANNEL TIME RESOLUTION SHOULD BE LESS THAN 3 COUNTS,
78. � FITTED SLOPE OF THE LINEAR FIT SHOULD BE 1+-0.01.
79. A WARNING MESSAGE WILL BE ISSUED FOR:
80. a) BAD LINEARITY FIT (MEAN SQUARE ERROR < 0),
81. b) POSSIBLE DEAD CHANNEL (MINIMUM TDC TIME RESOLUTION <= 0),
82. c) BAD TIME RESOLUTION (MAXIMUM TDC TIME RESOLUTION >= 3),
83. d) BAD SLOPE (LINEARITY | 1.0 - |SLOPE| | > 0.01).
84. GAIN SCAN (“GAIN” STATION)
85. THE FIFTH TEST IS A GAIN SCAN, TO MEASURE EACH CHANNEL'S ADC (WIDTH) RESOLUTION AND VERIFY A LINEAR GAIN WITHIN A CERTAIN RANGE (CALIBRATION CAPACITOR FROM100FF TO 400FF).
86. AT THE FIRST ORDER OF APPROXIMATION, THE CALIBRATION SIGNAL IS PROPORTIONAL TO THE CALIBRATION CAPACITOR'S CAPACITANCE. THE CHARGE OF THE SIGNAL IS MEASURED WITH A WILKINSON ASD CIRCUIT. THE CHARGE WIDTH (MEASURED IN NS) IS
87. WIDTH = MINWIDTH + Q/I.
88. THE TOTAL CHARGE FOR A CALIBRATION SIGNAL IS PREDICTED AS:
89. Q = CCAL*V0*(1.0 - EXP(-C2/CCAL))
90. WHERE CCAL IS THE CAPACITANCE OF THE CALIBRATION CAPACITOR AND V0 IS THE MAXIMUM VOLTAGE ON IT (AFTER AMPLIFICATION, V0 IS PROPORTIONAL TO THE GAIN) AND C2 IS A CIRCUIT DEPENDENT CONSTANT.
91. THE WIDTH MEASURED FROM A CALIBRATION RUN WILL BE
92. WIDTH = MINWIDTH + Q/I = MINWIDTH + K*CCAL*(1.0 - EXP(-C2/CCAL))
93. WHERE K = V0/I AND C2 = MINWIDTH/R.
94. THE CHARGE WIDTH IS MEASURED WITH 7 DIFFERENT CALIBRATION CAPACITORS (100, 150, 200, 250, 300, 350 AND 400 FF), AND THE VALUES ARE FITTED WITH THE ABOVE WIDTH DISTRIBUTION. THE FIT QUALITY IS A MEASURE OF THE LINEARITY OF THE GAIN. THE INTRINSIC WIDTH RESOLUTION IS MEASURED BY THE VARIATION WITHIN EACH GAIN SETTING.
95. THE SCAN IS ORGANIZED IN 7 RUNS OF 10K EVENTS EACH, ASD THRESHOLD IS -50MV, ASD HYSTERESIS IS 2.5MV, TRIGGERED AS TTCVI CALIBRATION TRIGGER (~1.8KHZ), FOR A TYPICAL TOTAL TEST TIME OF 4 MINUTES.
96. THE REQUIREMENT IS THAT FOR THE LINEAR FIT CHI2/DOF < 1.0. THERE ARE NO REQUIREMENTS ON THE INTRINSIC RESOLUTION.
97. RECORDED QUANTITIES (FOR EACH CHANNEL):
98. a) MEZZANINE CARD NUMBER AND CHANNEL NUMBER,
99. b) CALIBRATION CAPACITOR'S CAPACITANCE
100. c) AVERAGE ADC (WIDTH) IN COUNTS
101. d) WIDTH RESOLUTION IN COUNTS
102. e) RATIO OF ACTUAL GAIN OVER EXPECTED GAIN (1.0 FOR BAD FIT!)
103. f) MINIMUM WIDTH IN COUNTS
104. g) WIDTH FIT CONSTANTS K AND C2
105. h) MEAN SQUARE ERROR OF THE WIDTH FIT
106. i) CHI2 PER NUMBER DEGREE FREEDOM OF THE WIDTH FIT
107. j) MINIMUM AND MAXIMUM WIDTH RESOLUTION IN COUNT (1 COUNT = 0.78125 NS)
108. k) MINIMUM AND MAXIMUM FRACTION OF HITS ARE USED TO COMPUTE WIDTH RESOLUTION
109. l) MINIMUM AND MAXIMUM RATIO OF ACTUAL GAIN OVER EXPECTED GAIN.
110. ELECTRONIC TESTS HV ON
111. WITH CHAMBER HV ON WE THEN REPEAT THE FOUR ELECTRONIC SCANS (THRESHOLD, INJECTION, LINEARITY, AND GAIN) IN THE SAME WAY AND WITH THE SAME REQUIREMENTS AS DESCRIBED FOR THE CORRESPONDING TESTS WITHOUT HV. WE DO NOT HOWEVER REJECT MEZZANINE CARDS BASED ON THE RESULTS OF THE HV ON TEST IF NOT DRAMATICALLY DIFFERENT FROM THE HV OFF. FOR MEZZANINE CARD(S) WHERE BAD CORRELATION IS OBSERVED IN THE THRESHOLD SCAN TEST, WE DO REQUIRE A CLOSER LOOK AT THE COSMIC RAY DATA (TDC/ADC SPECTRA) FOR THAT CHANNEL TO DETERMINE IF THE CARD(S) NEED TO BE REPLACED.
112. PRETEST HV ON
113. THE TESTS WITH MDT CHAMBER HV ON STARTS AGAIN WITH A DAQ HARDWARE CHECKING (STILL AROUND 10 MINUTES) TO INSURE DAQ SYSTEM STILL WORKS PROPERLY.
114. NOISE RUN HV ON (“BKG” STATION TYPE “ON”)
115. THERE FOLLOWS A 20 MINUTES NOISE TEST WITH TTCVI RANDOM TRIGGER 5KHZ AT AN EFFECTIVE THRESHOLD IS
116. -50MV AND ASD HYSTERESIS IS 8.75MV. THE MAIN PURPOSE IS TO MAKE SURE THAT THE MDT CHAMBER ELECTRONICS HAVE A LOW NOISE LEVEL EVEN WITH HV ON. IT ALSO IDENTIFIES ANY DEAD CHANNELS OR TUBES.
117. THE REQUIREMENT IS THAT FOR EACH CHANNEL-TUBE PAIR BOTH ASD AND TUBE NOISE SHOULD BE BELOW 5 KHZ AND THERE ARE NO DEAD CHANNELS (DUE TO ELECTRONICS). THE RECORDED QUANTITIES ARE THE SAME AS FOR THE ANALOGOUS NOISE RUN WITH HV OFF.
118. A WARNING WILL BE ISSUED FOR:
119. a) DEAD TUBES (EFFICIENCY <= 10%)
120. b) CHANNELS WITH HIGH ASD NOISE RATE (>= 5 KHZ), HIGH TUBE NOISE (IN THE RANGE [2,5) KHZ),
121. c) VERY HIGH TUBE NOISE (>= 5 KHZ).
122. AN INFO MESSAGE WILL FLAG LOW EFFICIENCY TUBES (TUBE NOISE RATE BETWEEN 20% AND 80% OF EXPECTED COSMIC RAY HIT RATE).
123. EXTRA NOISE RUN HV ON (“BKG” STATION TYPE “CR50”)
124. WITH HV ON WE (PROPOSE TO) PERFORM ALSO A SHORT "CHAMBER" NOISE AND MAPPING TEST, SIMILAR TO THE COSMIC RAY RUN. THIS WILL SAVE TIME BY IDENTIFYING PROBLEMS (SUCH AS HOT/DEAD TUBE, WRONG CABLING ETC.) WITHOUT THE NEED TO WAIT FOR A LONG COSMIC RAY RUN.
125. THE TEST USES THE COSMIC RAY TRIGGER, BUT WITH EFFECTIVE THRESHOLD AT -50MV, ASD HYSTERESIS OF 8.75MV AND A TOTAL DAQ TIME OF 30 MINUTES. THE REQUIREMENTS ARE TO HAVE A GOOD CHAMBER MAPPING USING HIT DISTRIBUTIONS FOR EACH LAYER, GOOD RELATIVE TUBE EFFICIENCY (BETWEEN 0.8 TO 1.2), NORMAL ADC (WIDTH) DISTRIBUTION FOR ALL TUBES, AND A FRACTION OF UNPAIRED LEADING EDGE LESS THAN 5%.
126. RESULTS BREAK DOWN INTO THE FOLLOWING CASES:
127. a) TUBE EFFICIENCY IS BELOW 0.1 (DEAD TUBE/CHANNEL);
128. b) TUBE EFFICIENCY IS MORE THAN 2 (VERY HOT TUBE), THIS IS ROUGHLY A 5KHZ NOISE RATE;
129. c) TUBE EFFICIENCY BETWEEN 0.1 TO 0.8 (LOW EFFICIENCY);
130. d) TUBE EFFICIENCY IS BETWEEN1.2 TO 2 (HOT CHANNEL) (CHECK WHETHER THE CORRESPONDING TUBE ADC SPECTRUM, THAT IS THE WIDTH DISTRIBUTION, IS NORMAL).
131. ALSO, IF MORE THAN 5% OF LEADING EDGES ARE UNPAIRED, THE MEZZANINE CARD PROBABLY HAS A PROBLEM OR THE TUBE HAS VERY LONG MAXIMUM DRIFT TIME.
132. THE FOLLOWING INFORMATION IS RECORDED:
133. a) MEZZANINE CARD NUMBER AND CHANNEL NUMBER,
134. b) NUMBER OF GOOD HITS,
135. c) CHANNEL RELATIVE EFFICIENCY,
136. d) ASD NOISE RATE,
137. e) ROW NUMBER,
138. f) TUBE NUMBER.
139. COSMIC RAY RUN (“CR” STATION)
140. THE LAST TEST IS THE LONG COSMIC RAY RUN (EXTERNAL COSMIC RAY TRIGGER) WITH AN EFFECTIVE THRESHOLD OF
141. -40MV, ASD HYSTERESIS OF 8.75MV, AND A DAQ TIME FROM 10 TO 15 HOURS. THE TEST SHOULD BE LONG ENOUGH TO GET AT LEAST 40K HITS PER TUBE TO INSURE THAT A GOOD FIT CAN BE PERFORMED TO DETERMINE
142. T0 AND MAXIMUM DRIFT TIME.
143. THE REQUIREMENT IS TO HAVE CONSISTENT MEASUREMENTS ACROSS ALL TUBES, WHERE AN ABNORMAL TUBE IS DEFINED AS BEING SIGNIFICANTLY DIFFERENT COMPARED WITH THE NEARBY TUBES (HERE ASSUMING MAJORITY TUBES ARE OK).
144. EX: IF THE CHAMBER GAS MIXTURE IS CORRECT (AR/CO2 93%/7%), THE EXPECTED MAXIMUM DRIFT TIME IS AROUND 700NS. MEASUREMENTS MAY GIVE A MAXIMUM DRIFT TIME OF 800NS FOR ALL TUBES. IN SUCH CASE, MOST LIKELY THE CHAMBER IS FINE AND ONLY THE GAS IS WRONG.
145. SPECIFICALLY, THESE AREAS ARE CHECKED:
146. � GOOD CHAMBER MAPPING BY USING HIT DISTRIBUTIONS OF EACH CHAMBER LAYER AND MUON TRACK RECONSTRUCTION,
147. � GOOD RELATIVE TUBE EFFICIENCY (BETWEEN 0.9 TO 1.1),
148. � NORMAL TDC TIME SPECTRUM FOR ALL TUBES (SUCH AS A SHARP SLOPE NEAR T0, THE SHAPE OF THE SPECTRUM... FURTHER STUDY/UNDERSTANDING IS NECESSARY IF AN INDIVIDUAL TDC SPECTRUM LOOKS ABNORMAL).
149. � NORMAL ADC (WIDTH) DISTRIBUTION FOR ALL TUBES (FOR INSTANCE, NO DOUBLE PEAK, NOT A VERY FAT DISTRIBUTION ETC...)
150. � NO CHANNELS WITH VERY HIGH ASD NOISE RATES (IF THE ASD NOISE RATE OF ANY INDIVIDUAL CHANNEL IS MORE THAN 40KHZ OR THE ASD NOISE RATES OF ANY THREE OR MORE CHANNELS OF THE SAME ASD CHIP ARE MORE THAN 5KHZ WE USUALLY REPLACE THE MEZZANINE CARD)
151. � MAXIMUM FRACTION OF UNPAIRED LEADING EDGES SHOULD LESS THAN 10%
152. � NORMAL BACKGROUND BEFORE T0 AND AFTER TMAX
153. � NORMAL T0 (I.E., ALL TUBES HAVE SIMILAR T0)
154. � NORMAL TMAX TO MAKE SURE NO BAD MAXIMUM DRIFT TIME.
155. RECORDED QUANTITIES (FOR EACH TUBE):
156. a) EFFICIENCY, MEASURED AS A RATIO BETWEEN THE MEASURED NUMBER OF HITS AND THE EXPECTED NUMBER FROM A FIT OF THE HIT RATE PLOT FOR ALL THE TUBES OF THE SAME MULTILAYER;
157. b) FITTED T0, HALF HEIGHT OF LEADING EDGE OF THE TDC SPECTRUM
158. c) FITTED T0 RISE TIME, SLOPE OF THE LEADING EDGE OF THE TDC SPECTRUM
159. d) FITTED DRIFT TIME, DIFFERENCE BETWEEN THE FITTED TMAX, TRAILING EDGE OF THE TDC SPECTRUM AND THE FITTED T0
160. e) FITTED TMAX FALL TIME (SLOPE OF THE FALLING EDGE OF THE TDC SPECTRUM)
161. f) NOISE RATES BELOW T0, ABOVE TMAX, AND ASD NOISE
162. g) AMT CHARGE WIDTH PEAK POSITION AND ITS RMS FROM A GAUSSIAN FIT OF THE CENTRAL PART OF THE DISTRIBUTION (REMOVING THE TAILS)
163. h) TOTAL NUMBER OF HITS BEFORE AND AFTER THE CHARGE WIDTH CUT (TO REMOVE THE ASD NOISE).
164. FOR EACH CHAMBER WE ALSO CALCULATE THE CHAMBER AVERAGE AND THE STANDARD DEVIATION FOR EACH ONE OF THE PREVIOUSLY MENTIONED PHYSICAL PARAMETERS. WE THEN FLAG ANY TUBE IF ONE OF ITS PARAMETERS IS MORE THAN FIVE SIGMAS FROM THE CORRESPONDING CHAMBER AVERAGE.
165. 10.2 SUMMARY AND STRUCTURE OF THE COMMISSIONING DATABASE
166. THE STRUCTURE OF THE COMMISSIONING DATABASE REFLECTS THE CURRENT COMMISSIONING PROCEDURES. ALL THE MEASUREMENTS ARE CARRIED OUT IN A SET OF “STATIONS”. AS THE NAME SUGGESTS, EACH STATION CARRIES OUT ONE SPECIFIC TASK. EACH STATION IS MANNED BY ONE OR TWO OPERATORS. EACH STATION GENERATES SEPARATE TEXT DATA FILES, WHICH WILL BE PROCESSED BY PERL PROGRAMS TO INPUT DATA INTO THE DATABASE.
167. WE DEFINE A “RUN” AS PERIOD OF MEASUREMENT FOR EACH STATION. DURING A “RUN”, THE MEASUREMENT IN THAT STATION IS ASSOCIATED WITH A SET OF PARAMETERS WITH FIXED VALUES. FOR EXAMPLE, EACH “RUN” IN THE DARK CURRENT STATION IS ASSOCIATED WITH SUCH PARAMETERS AS THE ARGON PERCENTAGE IN DARK CURRENT GAS (DARKCURPERCAR), CO2 PERCENTAGE IN THE DARK CURRENT GAS (DARKCURPERCCO2), OPERATIONAL HV (HVOP), AVERAGE INPUT PRESSURE DURING THIS RUN, AND SO ON. SINCE THEY ARE CONSTANT DATA IN THAT “RUN”, WE SET UP A SEPARATE PARAMETER TABLE FOR EACH STATION TO REDUCE DATA REDUNDANCY IN THE DATABASE. WE LIKEWISE CREATE A ‘RUN’ TABLE FOR EACH STATION, RECORDING THE INPUT FILE, START AND STOP TIME AND OPERATORS. THE “OPERATION” TABLE FOR A STATION CONTAINS THE ACTUAL DATA ACQUIRED.
168. HERE IS THE LISTING OF THE TABLES AND THEIR FIELDS FOR EACH STATION:
169. TABLES FOR ELECTRONIC NOISE RUNS (“BKG STATION”)
170. 10.3 APPENDIX 3: EXAMPLES OF “STATION” TEXT FILES
171. THIS APPENDIX CONTAINS EXAMPLE “INPUT” FILES FOR THE DATABASE. EACH ACTIVITY RELATED TO CHAMBER PHASE I COMMISSIONING IS ASSIGNED A “STATION” NAME. THESE ACTIVITIES CAN PROCEED INDEPENDENT OF THE DATABASE SERVER AND ARE RECORDED INTO A SPECIFICALLY FORMATTED FILE AS SHOWN BELOW. THESE FILES ARE “PUBLISHED” INTO A SPECIFIC LOCATION ONCE THE OPERATOR HAS COMPLETED AND CHECKED THE RESULTS.
172. NOISE RUN HV (“BKG” STATION)
173. DATA FILE NAME FORMAT: BKG<TYPE>_<YYYY>_<MM>_<DD>_<HH>_<MM>_<CHAMBER>.TXT
174. <TYPE> IS TYPE OF RUN: ON (HV ON) OR OFF (HV OFF) OR CR50
175. EXAMPLE: BKGCR50_2004_10_22_20_20_EML3A01.TXT
176. CHAMBERNAME EML3A01 MIC034
177. RUNNUMBER 64901
178. HVSTATUS 1
179. TRIGGERSELECTION 1
180. STARTDT OCT_05_2004_12:41:27
181. ENDDT OCT_05_2004_13:11:33
182. DAQTIME 0H30M0S 1800
183. THRESHOLDSETTINGS DATABASE
184. EFFECTIVETHRESHOLD(MV) -50.00
185. AMTMATCHWINDOW(US) 1.275
186. ASDWILKINSONINTEGRATIONGATE(NS) 18.50 18.50 18.50
187. ASDWILKINSONRUNDOWNCURRENT(UA) 4.50 4.50 4.50
188. ASDWILKINSONTHRESHOLD(MV) 94.00 94.00 94.00
189. ASDDEADTIME(NS) 536.30 536.30 536.30
190. ASDNOISECHARGEWIDTHCUT(NS) 35.938
191. NUMBEREVENT 537554
192. TRIGGERRATE(HZ)_(AVG_MIN_MAX) 297.85 261.87 334.16
193. DAQRATE(HZ)_(AVG_MIN_MAX) 298.40 212.092 466.39
194. EVENTSIZE(KB)_(AVG_MIN_MAX) 5.8779 0.0000 861.0000
195. ML L T NHITS NOISE(KHZ) ASD(KHZ)
196. 1 1 1 3412 0.000 0.028
197. 1 1 2 3471 0.000 0.009
198. 1 1 3 3661 0.000 0.178
199. …[DATA FOR REST OF TUBES IN CHAMBER]
200. HARVARD ASD DB DATA (“BMC” STATION)
201. DATA FILE NAME FORMAT: BMC_<CHAMBER>.TXT
202. EXAMPLE: BMC_2004_12_10_00_00_EML3A01.TXT
203. CHAMBERNAME EML3A01 MIC034
204. STARTDT DEC_10_2004_00:00:00
205. ENDDT DEC_10_2004_00:00:00
206. ML L T M C BARCODE BOARDID ASDOFFSET SIGMA CHI2 NDOF NORM EFF XTALK MEZZOFF ASDCOR
207. 1 1 1 1 1 41-316-08-07808 160807808 3.56841 7.88772 1.87318 9 11.381 1.00000 0.00000 0.26573 2
208. 1 1 2 1 3 41-316-08-07808 160807808 5.76382 8.01295 3.48786 8 11.291 1.00000 0.00000 1.20637 2
209. 1 1 3 1 5 41-316-08-07808 160807808 -3.65219 6.92753 0.96914 6 12.324 1.00000 0.00000 -6.00102 2
210. …[DATA FOR REST OF TUBES IN CHAMBER]
211. FINAL COSMIC-RAY TEST (“CR” STATION)
212. DATA FILE NAME FORMAT: CR_<YYYY>_<MM>_<DD>_<HH>_<MM>_<CHAMBER>.TXT
213. EXAMPLE: CR_2004_11_18_17_04_EML3A01.TXT
214. CHAMBERNAME EML3A01 MIC034
215. RUNNUMBER 64902
216. CHAMBERPRESSURE(BAR) 3.00
217. CHAMBERTEMPERATURE(C) 18.00
218. GASCOMPOSITIONCO2(%) 7.00
219. STARTDT SEP_05_2004_13:15:0
220. ENDDT SEP_05_2004_22:46:3
221. HVTOPML(V) 3080.0
222. HVBOTTOMML(V) 3080.0
223. THRESHOLDSETTINGS DATABASE
224. EFFECTIVETHRESHOLD(MV) -40.00
225. HYSTERESIS(MV) 8.75
226. AMTMATCHWINDOW(US) 1.275
227. ASDWILKINSONINTEGRATIONGATE(NS) 18.50 18.50 18.50
228. ASDWILKINSONRUNDOWNCURRENT(UA) 4.50 4.50 4.50
229. ASDWILKINSONTHRESHOLD(MV) 94.00 94.00 94.00
230. ASDDEADTIME(NS) 536.30 536.30 536.30
231. ASDNOISECHARGEWIDTHCUT(NS) 35.000
232. TOTALNUMBEREVENTS 10537401
233. TOTALNUMBERFLAGGEDTUBES 4
234. TOTALNUMBERDEADTUBES 0
235. EFFICIENCY_(AVG_SIGMA_#FLAG) 1.001 0.042 0
236. T0(NS)_(AVG_SIGMA_#FLAG) 60.100 5.414 0
237. T0RISE(NS)_(AVG_SIGMA_#FLAG) -6.247 0.398 0
238. DRIFTTIME(NS)_(AVG_SIGMA_#FLAG) 677.152 6.116 0
239. TMAXFALL(NS)_(AVG_SIGMA_#FLAG) 37.300 5.389 0
240. NOISEBELOWT0(KHZ)_(AVG_SIGMA_#FLAG) 1.198 2.122 3
241. NOISEABOVETMAX(KHZ)_(AVG_SIGMA_#FLAG) 1.114 2.121 3
242. ASDNOISE(KHZ)_(AVG_SIGMA_#FLAG) 1.009 1.838 2
243. CHARGEWIDTHMAX(NS)_(AVG_SIGMA_#FLAG) 110.235 13.177 0
244. CHARGEWIDTHRMS(NS)_(AVG_SIGMA_#FLAG) 23.016 2.978 0
245. ML L T FLAG EFFICIENCY T0(NS) T0RISE(NS) DRIFTTIME(NS) TMAXFALL(NS) T0NOISE(KHZ) TMNOISE(KHZ) ASDNOISE(KHZ) CWPEAK(NS) CWRMS(NS) #TOTHITS #SIGHITS
246. 1 1 1 0 1.038 67.661 -5.802 689.583 30.259 0.605 0.403 0.402 117.910 23.852 67451 60671
247. 1 1 2 0 1.075 68.733 -6.057 688.728 27.342 0.412 0.264 0.238 122.986 25.178 68189 64175
248. 1 1 3 0 0.976 65.395 -5.652 685.903 30.641 5.035 5.037 4.747 110.875 23.244 139571 59531
249. …[DATA FOR REST OF TUBES IN CHAMBER]
250. INJECTION SCAN (‘INJ” STATION)
251. DATA FILE NAME FORMAT: INJ<TYPE>_<YYYY>_<MM>_<DD>_<HH>_<MM>_<CHAMBER>.TXT
252. <TYPE> IS TYPE OF RUN: ON (HV ON) OR OFF (HV OFF)
253. EXAMPLE: INJOFF_2004_10_22_20_20_EML3A01.TXT
254. 10.4 APPENDIX 3: TABLES FOR MAPPING TUBE ID TO ELECTRONICS CHANNEL
11. TABLE INDEX
12. FIGURE INDEX
ATTACHMENT: CHAMBER CHECKLIST “TRAVELLER”
THE FOLLOWING PAGES ARE A COPY OF THE CHAMBER CHECKLIST WE HAVE DESIGNED TO TRAVEL WITH EACH CHAMBER. IT TRACKS ALL IMPORTANT COMMISSIONING TASKS FOR EACH CHAMBER.

MICHIGAN ATLAS CHAMBER COMMISSIONING DATABASE

DECEMBER 14, 2004

SHAWN MCKEE, J WEHRLEY CHAPMAN, TIESHENG DAI, EDWARD DIEHL, CLAUDIO FERRETTI, DANIEL LEVIN, RUDOLF THUN, ZHENGGUO ZHAO AND BING ZHOU

DEPARTMENT OF PHYSICS

UNIVERSITY OF MICHIGAN

ANN ARBOR, MICHIGAN 48109

THE UNIVERSITY OF MICHIGAN CHAMBER COMMISSIONING DATABASE

TABLE OF CONTENTS

1. ABSTRACT 4

2. INTRODUCTION 4

3. OUTLINE OF PAPER 5

4. DATABASE DESIGN PHILOSOPHY 5

5. COMMISSIONING CHAMBER COMPONENTS AND TESTS 6

6. UM DATABASE IMPLEMENTATION OVERVIEW 9

6.1 DATA INPUT 9

6.2 WEB INTERFACE 10

7. PLANNED FUTURE EXPLORATIONS 10

8. FIGURES 10

9. REFERENCES 30

10. APPENDICES 31

10.1 SHORT DESCRIPTION OF THE ELECTRONICS TESTS 31

10.1.1 Pretest HV Off 31

10.1.2 Noise Test HV Off (“Bkg” type “off” station) 31

10.1.3 Threshold Scan (“Thr” station) 32

10.1.4 Injection Scan (“Inj” station) 33

10.1.5 Linearity Scan (“Lin” station) 33

10.1.6 Gain Scan (“Gain” station) 34

10.1.7 Electronic Tests HV On 35

10.1.8 Pretest HV On 35

10.1.9 Noise Run HV On (“Bkg” station type “on”) 35

10.1.10 Extra Noise Run HV On (“Bkg” station type “cr50”) 35

10.1.11 Cosmic Ray Run (“CR” station) 36

10.2 SUMMARY AND STRUCTURE OF THE COMMISSIONING DATABASE 37

10.2.1 Tables for Electronic Noise Runs (“Bkg station”) 37

10.2.2 Tables for Harvard ASD DB Data (“BMC” station) 38

10.2.3 Tables for Cosmic Ray Data (“CR” station) 39

10.2.4 Tables for Electronics Gain scan Data (“Gain” station) 41

10.2.5 Tables for ELectronics Injection Scan Data (“Inj” station) 42

10.2.6 Tables for Electronics Linearity scan Data (“Lin” station) 42

10.2.7 Tables for Mezzanine Card Noise Scan Data (“Mezz” station) 43

10.2.8 Tables for Mezzanine Card Serial Numbers (“MezzSN” station) 44

10.2.9 Tables for Electronics Parts Serial Numbers (“SN” station) 44

10.2.10 Tables for Threshold Scan Data (“Thr” station) 45

10.2.11 Tables for B sensor Serial numbers (“Bsensor” station) 46

10.2.12 Tables for Chamber Dark Current Data (“ChDC” station) 46

10.2.13 Tables for Chamber Leak Data (“ChLeak” station) 47

10.2.14 Tables for HV Hedgehog Card Serial Numbers (“HVHH” station) 48

10.2.15 Tables for Chamber Parts Installation Data (“Parts” station) 48

10.2.16 Tables for Signal Hedgehog Card Serial Numbers (“ROHH” station) 49

10.2.17 Tables for Chamber Survey Target Data (“survey” station) 49

10.2.18 Tables for Chamber Traveler Data (“Traveler” station) 50

10.2.19 Tables for Temperature Sensor ID Numbers (“Tsensor” station) 51

10.2.20 Tables for Inplane Rasnik Granite Table Measurements (“Inplane” station) 51

10.2.21 Tables for PMO Mount ID numbers (“PMOmnt” station) 52

10.3 APPENDIX 3: E XAMPLES OF “ STATION” TEXT FILES 53

10.3.1 Noise Run HV (“Bkg” Station) 53

10.3.2 Harvard ASD DB Data (“BMC” station) 53

10.3.3 Final Cosmic-Ray Test (“CR” station) 54

10.3.4 Injection Scan (‘Inj” station) 55

10.3.5 Linearity Scan (“Lin” station) 55

10.3.6 Mezzanine Card Serial Numbers (“MezzSN” station) 55

10.3.7 Offset Correlation (“Mezz” station) 55

10.3.8 Chamber Electronics Serial Numbers (“SN” station) 56

10.3.9 Threshold Scan (”Thr” station) 56

10.3.10 B Sensors ID file (“Bsensor” station) 56

10.3.11 Dark Current (“ChDC” station) 57

10.3.12 Chamber Leak Test (“ChLeak” station) 57

10.3.13 High Voltage Hedgehog Cards Station (“HVHH” station) 57

10.3.14 Signal Hedgehog Cards Station (“ROHH” station) 57

10.3.15 Survey Target Station File (“Survey” station) 58

10.3.16 Parts File (“Parts” station) 58

10.3.17 Chamber Traveler (“Traveler” station) 58

10.3.18 Temperature Sensor (“Tsensor” station) 59

10.3.19 Inplane Granite/Gradient Measurement (“Inplane” station) 59

10.3.20 PMO Mask Mount Station (‘PMOmnt’ station) 59

10.4 APPENDIX 3: TABLES FOR MAPPING TUBE ID TO ELECTRONICS CH ANNEL 60

11. TABLE INDEX 68

12. FIGURE INDEX 68

ATTACHMENT: CHAMBER CHECKLIST “TRAVELLER” 68

The University of Michigan ATLAS Chamber Commissioning Database

1. ABSTRACT

WE DESCRIBE HEREIN THE DESIGN PHILOSOPHY AND THE IMPLEMENTATION DETAILS OF THE UNIVERSITY OF MICHIGAN ATLAS PHASE I CHAMBER COMMISSIONING DATABASE. DETAILS ARE GIVEN THAT WOULD BE USEFUL TO OTHER INSTITUTES WISHING TO ESTABLISH A SIMILAR FACILITY OR FOR USE AS A DESIGN BASIS FOR OTHER CHAMBER COMMISSIONING.

2. INTRODUCTION

OVER THE NEXT FEW YEARS THE ATLAS COLLABORATION WILL NEED TO TEST, AND COMMISSION A MASSIVE HIGH PRECISION MUON SPECTROMETER CONSISTING OF MORE THAN ONE MILLION READOUT CHANNELS. THE PROPER PERFORMANCE OF THIS INSTRUMENT IS ABSOLUTELY CRITICAL TO THE SUCCESS OF THE EXPERIMENT, PARTICULARLY SINCE ONE OF THE KEY PHYSICS GOALS IS THE DETECTION OF THE HIGGS BOSON, AND THE FOUR-MUON DECAY IS EXPECTED TO BE ONE OF THE PRINCIPAL DISCOVERY MODES.

AFTER THE BASE MDT CHAMBER CONSTRUCTION, THE UNIVERSITY OF MICHIGAN HAS MOVED TO THE NEXT PHASE OF THE MUON DETECTOR WORK: COMMISSIONING AND TESTING THE MUON CHAMBERS. MICHIGAN CHAMBERS CONSIST OF SOME OF THE LONGEST DRIFT TUBES USED IN THE EXPERIMENT AND ARE SUBJECT TO A UNIQUE VARIETY OF DESIGN, PRODUCTION AND COMMISSIONING CHALLENGES.

THE SUCCESS OF THE CHAMBER PRE-COMMISSIONING (SO CALLED PHASE I COMMISSIONING PRIOR TO DETECTOR INSTALLATION) WILL DEPEND CRITICALLY ON THE CREATION AND MAINTENANCE OF A COMPREHENSIVE DATABASE THAT IS TO CONTAIN THE RELEVANT EVOLUTIONARY HISTORY AND CHARACTERIZATION OF EACH MUON CHAMBER COMPONENT AND TEST.

THERE ARE A NUMBER OF COMPONENTS TO BE INSTALLED ON CHAMBER AND TESTS TO BE RUN DURING CHAMBER COMMISSIONING . WE WILL PROVIDE DETAILS OF THE TRACKED COMPONENTS AND TESTS IN SECTION 5 OF THIS PAPER. IN ADDITION WE HAVE DESIGNED A “CHAMBER CHECKLIST” WHICH IS INTENDED TO BE STORED WITH EACH CHAMBER AND UPDATED AS THE CHAMBER PROGRESSES THRU COMMISSIONING AND TESTING. THE DETAILED CHECKLIST IS PROVIDED AS ATTACHMENT I. THE STRUCTURE OF OUR COMMISSIONING DATABASE REFLECTS THE STEPS FOLLOWED IN THE COMMISSIONING AND TESTING OF THE CHAMBERS.

WE PRESENT HEREIN THE PHILOSOPHY THAT GUIDED US IN THE DEVELOPMENT OF THIS DATABASE, AND REFERENCE THE REPOSITORY OF CODE THAT MAY BE REQUIRED AS UPGRADES ARE MADE TO THE PACKAGE IN THE YEARS AHEAD.

THERE ARE SEVERAL NOVEL ELEMENTS IN OUR APPROACH. ONE IS A RATHER CLOSE LINKAGE BETWEEN OUR ACCESS DATABASE AND PAW (A CERN ANALYSIS PACKAGE), DESIGNED TO FACILITATE EXTENSIVE ANALYSIS OF THE CHAMBER DATA IN AN ENVIRONMENT THAT IS FAMILIAR TO A LARGE NUMBER OF THE PROJECT’S PHYSICISTS. ANOTHER IS THE USE OF A TANDEM DATABASE STRUCTURE WHERE APPROPRIATE SUBSETS OF THE FINAL LOCAL DATA IS ROUTINELY CAPTURED AND MADE AVAILABLE TO OTHER ATLAS DATABASES. INDEED, THIS ARRANGEMENT WILL PERMIT ONGOING UPGRADES TO THE MAIN LOCAL DATABASE, WHILE YET PROVIDING A STABLE FEED TO THE OTHER DATABASES. AN ADDITIONAL UNIQUE FEATURE IS THE PROVISION WE HAVE MADE TO INSURE THAT THE ESSENTIAL FUNCTIONS OF THE DATABASE ARE ACCESSIBLE REMOTELY VIA THE WEB.

OTHER DETAILS WILL BE DESCRIBED HEREIN THAT WE HOPE WILL BE OF VALUE TO OTHER INSTITUTES AS THEY DESIGN AND DEPLOY THEIR DATABASES.

3. OUTLINE OF PAPER

IN SECTION 4 WE DISCUSS THE GUIDING PRINCIPLES WE USED IN ESTABLISHING OUR DATABASE. THE DETAILS OF THE COMMISSIONING COMPONENTS AND TESTS ARE DESCRIBED IN SECTION 5, INCLUDING TABLES OF RECORDED QUANTITIES. IN SECTION 6 WE PROVIDE AN OVERVIEW OF THE DATABASE IMPLEMENTATION. SECTION 7 CONCLUDES WITH A VIEW ABOUT POSSIBLE FUTURE WORK.

SECTION 8 IS A SET OF FIGURES DETAILING IMPORTANT INFORMATION FOR CHAMBER COMMISSIONING. SECTION 9 INCLUDES ALL REFERENCES. SECTION 10 ARE A SET OF APPENDICES SHOWING DETAILED INFORMATION ABOUT THE DATABASE, INPUT FILE FORMATS AND TUBE TO ELECTRONICS CHANNEL MAPPINGS. THE PAPER CONCLUDES WITH AN ATTACHMENT OF OUR “CHAMBER TRAVELER” SHOWING THE DETAILS RECORDED ON PAPER AND STORED WITH EACH CHAMBER.

4. DATABASE DESIGN PHILOSOPHY

THERE ARE SEVERAL BASIC PRINCIPLES WE HAVE TRIED TO ADHERE TO AS THE DATABASE STRUCTURE WAS ESTABLISHED. MANY OF THESE WILL, AT FIRST, APPEAR TO BE OBVIOUS. BUT, EVEN A SIGNIFICANT FRACTION OF THESE ARE SUBJECT TO A REASONABLE DEBATE.

TO GIVE JUST ONE EXAMPLE, IN THIS DAY AND AGE OF FAST COMPUTERS AND CHEAP DATA STORAGE COST, ONE MIGHT THINK IT REASONABLE TO MEASURE AND RECORD EACH AND EVERY CONCEIVABLE BIT OF INFORMATION ABOUT EVERY COMPONENT THAT GOES INTO THE MUON CHAMBERS. AFTER ALL, IT MAY BE ARGUED, WE MAY WISH TO HAVE ACCESS TO A PARTICULAR DATA ELEMENT FIVE YEARS FROM NOW, EVEN THOUGH WE SEE NO USE FOR IT NOW. THE COMPETING ARGUMENT IS THAT IF WE ARE NOT CAREFUL WE WILL DROWN IN USELESS INFORMATION AND WILL BE LED INTO A FALSE STATE OF BELIEVING WE CAN ACCEPT WIDE VARIANCES IN CHAMBER PARAMETERS NOW, SINCE WE PRESUMABLY COULD CORRECT FOR MOST MALADIES IN THE FUTURE. EVEN WORSE, THE ADDED BURDEN OF GENERATING AND RECORDING DATA WHICH MAY NEVER BE USED COULD CAUSE US TO FAIL TO MEET OUR SCHEDULE OR DRIVE OUR COSTS OVER BUDGET.

AGAINST THIS BACKGROUND, WE HAVE DECIDED TO ADOPT THE FOLLOWING SET OF GUIDELINES:

We will collect and store every piece of data that is known to bear directly on the principal physics performance of the muon chamber

We will collect and store chamber commissioning data related to the add-on components, commissioning conditions and commissioning test/verification procedures, including all information required by the ATLAS-wide muon coordinating groups like the MFT and Integration database groups.

We will automate each and every measurement possible. Each manual entry of a measured quantity to our database must be justified and approved for each case.

The database is to be available to any authorized user via the web. That is, key members of the ATLAS Muon group should be able to log on to the web anywhere in the world and, after sufficient authorization checks, have the same functionality as if he or she was in the commissioning lab.

Database backup should occur regularly, via replication, explicit backup to tape or disk and storage on RAID enabled system storage.

The initial database application backend will be based upon Microsoft ACCESS.

An ACCESS database, or whatever other application is specified by ATLAS, will be explicitly maintained to provide an interface to the ATLAS wide global databases.

5. COMMISSIONING CHAMBER COMPONENTS AND TESTS

THE INFORMATION WE NEED TO RECORD FOR COMMISSIONING IS CRITICAL TO CORRECTLY IDENTIFY EACH SINGLE COMPONENT. TOO MUCH INFORMATION WILL CAUSE NEEDLESS WORK, POSSIBLE DELAYS AND/OR COST OVERRUNS, WHILE TOO LITTLE INFORMATION RISKS MISSING RECORDING POTENTIALLY VITAL INFORMATION NEEDED DURING THE SYSTEMS OPERATION OR DATA ANALYSIS.

WE HAVE IDENTIFIED A NUMBER OF COMPONENTS AND TESTS FROM WHICH WE WILL GATHER SELECTED INFORMATION FOR STORAGE IN THE DATABASE. WHILE OTHER COMPONENTS WILL BE INSTALLED (CABLES, SAFETY BRACKETS, AMB, ETC.) WE DON’T HAVE ANY NEED TO RECORD THEIR DETAILS. THE LIST OF COMPONENTS WE WILL TRACK DURING CHAMBER COMMISSIONING INCLUDES:

n Survey Targets

n B Sensors

n PMO Mask Mounts

n Gas-bar Extension Tube Types

n Tubelet Types

n HV Hedgehog Cards

n Signal Hedgehog Cards

n Mezzanine Cards

n CSM Motherboard

n CSM Daughterboard

n DCS Box

The corresponding measurements and tests include:

n Multilayer gas leak rate

n Tube layer dark current rate

n MECCA test

n Inplane alignment measurements on granite table (copy from chamber production)

n Inplane gradient measurements (copy from base chamber production)

n Mezzanine card threshold scan

n Mezzanine card linearity scan

n Mezzanine card gain scan

n Temperature sensor test (readout values and IDs)

n Final cosmic-ray testing of full chamber

The following tables list the information we intend to record for each component or measurement. Implicit in each item is recording the Chamber ID barcode which gives the chamber mechanical ID, e.g., EML5C08.

Table 1 : Chamber Commissioning Components

Item	Number	Units and Details	Recording Method
Survey Targets	8	Locations are given in Brandeis chamber drawings (see Figure 5-Figure 14 on pages 14-23). There are 8 numbered positions which are the same for all chamber types. These positions are 5, 6, 7, 8, 9, 10, 11, and 12. So the data file will be a list of these 8 location numbers followed by the survey target ID at each location.	Typed into program
B Sensors	0, 2 , 4	Locations are given in Brandeis chamber drawings (see Figure 5-Figure 14 on pages 14-23). There are 0, 2, or 4 numbered positions depending on chamber type. Here are the locations used by each chamber type. EML4, EML5: no B sensors; EML3, EMS5: 13, 14; EMS4: 13, 14, 15, 16	Read by DCS Software
T Sensors	5	On the Michigan chambers there are 5 T sensor "strings", each of which has 4 T sensors, for a total of 20 T sensors per chamber. Each string has an ID number. The 4 T sensors per string are uniquely addressable, so only one ID number is required per string. Each string number is installed / cabled in a unique position on the chamber according to diagrams provided by UW. See Figure 19 and Figure 20. The temperature sensors are tested during chamber commissioning but the temperatures are not recorded since they have no long-term use.	Typed into program
PMO Mask Mount	1 or 2	Locations are given in Brandeis chamber drawings (see Figure 5-Figure 14 on pages 14-23). There are 1 or 2 numbered positions depending on chamber type. The numbers change for A and C type chambers. Here is the list of location numbers: EMS A type: 2, 3; EMS C type: 1, 4; EML A type: 3; EML C type: 4	Typed into program
ET Type	3	Record ET type (Brandeis, Seattle 1 or 2) for each Multilayer	Typed into program
Tubelet Type	3	Possible types: HIEM hard brass, ATB stainless, HIEM soft brass	Typed into program
HV Hedgehog Cards	12-18	The DB files will list the ID numbers by positions starting from 0 (UM chambers have 16 HV HH cards, all type I or II) which are shown on figures M and N. Chambers on sides A and C use the same numbering, though the physical positions differ for A and C chambers (see Figure 15 and Figure 16 on pages 24-24).	Typed into program
Signal Hedgehog Cards	12-18	The DB files will list the ID numbers by positions starting from 0 (UM chambers have 16 Signal HH cards, all type I or II) which are shown on figures M and N. Chambers on sides A and C use the same numbering, though the physical positions differ for A and C chambers (see Figure 15 and Figure 16 on pages 24-24).	Typed into program
Mezzanine Cards	12-18	The DB files will list the ID numbers by positions starting from 0 (UM chambers have 16 mezzanine cards) which are shown on figures M and N. Chambers on sides A and C use the same numbering, though the physical positions differ for A and C chambers (see Figure 15 and Figure 16 on pages 24-24).	Extracted from other tests
CSM MB	1	The CSM motherboard has a barcode with its ID	Extracted from tests (Table 2)
CSM DB	1	The CSM daughterboard has a barcode with its ID	Extracted from tests (Table 2)
DCS	1	The DCS box has a barcode with its ID, must also record serial #.	Extracted from tests(Table 2)

The set of commissioning measurements and tests is given in the following table

Table 2 : Chamber Commissioning Tests and Measurements

Item	Number	Units and Details	Recording Method
Chamber Leak Rate	6 (Each ML: initial, long term and final)	Millibar/day per ML and bar-l/s per tube. We also record relevant details (duration, environment conditions, etc.)	Leak station software
Dark current @3.4kV	6 (1 per layer)	MicroAmps. We also record relevant details (HV, gas, humidity)	Typed into program
Inplane RASNIK granite measurement	4 sets/chamber x 6 numbers	X gradient, Y gradient, X location (microns), Y location (microns), Magnification (no unit), and Tilt (milli-radiant). The inplane X and Y axes correspond to the chamber Z and Y axes, respectively (see Figure 2 pag.11). Conversion to the chamber coordinate system is done by multiplying the RASNIK X or Y value by the X or Y gradient. The gradients give the sign of the change of the RASNIK value when the center crossbeam is moved in the positve Z or Y direction (chamber coordinate direction).	Measured during base chamber construction by Rasnik software
Electronics Serial Numbers	22 codes	Each chamber set of electronics components is indicated by a unique ID: chamber name, serial number and ID, Motherboard serial number, DCS node, ID and barcode, mezzanine cards	Scanned and/or manually input when mounted on chamber
Mezzanine DB	Mezzanine cards parameters (15 number/card)	Copy of the most relevant mezzanine and ASD parameters measured during Harvard’s tests, used in all electronic tests.	From BMC database
Threshold scan	Fit offset per channel (8 number/chan)	Each mezzanine card will have its thresholds scanned for each channel. Serial numbers for mezzanines cards are recorded as well. Tests with and without HV on.	Measured by electronics DAQ software
Injection scan	Injection efficiency and crosstalk per channel (5 number/chan)	Each channel has test pulses injected and the channels efficiency and crosstalk measured. Tests are performed with and without HV on.	Measured by electronics DAQ software
Linearity scan	Timing linearity per channel (10 number/chan)	Each channel is measured with 19 different timing delays to determine linearity. Fit results (slope, intercept, error) recorded to DB. Tests with and without HV on.	Measured by electronics DAQ software
Gain scan	ADC gain per channel (13 number/chan)	Each channel has varying amounts of charge injected and gain measured. Fits results recorded to DB. Tests with and without HV on.	Measured by electronics DAQ software
Noise run	Noise levels for each channel (6 number/chan + DAQ settings)	Random trigger runs to measure the noise rates at high effective threshold for each channel. Tests are performed with and without HV on.	Measured by electronics DAQ software
Final cosmic-ray test	Chamber and single tube physical parameters (33 numbers +16 number/chan +DAQ settings)	Each tube will have the following set of numbers measured: relative efficiency, T0, T0rise, Tmax, Tmax Fall, Drift Time, Noise below T0, Noise above Tmax, noise ASD, number of hits, ADC parameters, Fit errors and chi-squared value for each fit parameter.	Measured by cosmic-ray test software. Runs will be 12-15 h long (enough to acquire ~20K events per tube)

Special note on the Inplane RASNIK System: The inplane RASNIK system is an optical position measuring system consisting of a RASNIK mask, a lens, and a CCD camera. The lenses are mounted on the center crossbeam, and the mask and CCD are mounted on opposite end crossbeams. The system monitors the relative positions of the CCD, lens, and mask. The DB has the measurements of the inplane system when the chamber was on the granite assembly table and presumed to be perfected aligned with no distortions. When the chamber is removed from the granite it will distort, and by comparing inplane measurements taken off the granite with those taken on the granite, one may determine the chamber distortions the directions perpendicular to the inplane RASNIK lines. The RASNIK mask has encoded in it an X-Y coordinate system. The RASNIK X and Y measurements refer to the coordinates system used by the Brandeis RASNIK image analysis program. The mask is positioned so that the RASNIK X coordinate corresponds to the chamber Z coordinate, and the RASNIK Y corresponds to the chamber Y coordinate, with the exception of a possible sign change between the RASNIK X-Y and the chamber Z-Y. In order to determine this possible sign change, the RASNIK gradient (orientation) is measured. While on the granite assembly table, chamber distortions are introduced in the chamber +Z and +Y directions, respectively, at the position of the center crossbeam, and the change of sign of the RASNIK measurements compared to an undistorted chamber are recorded.

To calculate a chamber distortion one should use the equations:

Z_chamber = Z_gradient* (X_Rasnik – X_granite)

Y_chamber = Y_gradient * (Y_Rasnik – Y_granite)

Hence, in our convention, a positive distortion of the Z or Y value of RASNIK measurement means that the center crossbeam is offset in the +Z or +Y direction relative to the ends of the chamber.

6. UM DATABASE IMPLEMENTATION OVERVIEW

6.1 DATA INPUT

THE LIST OF PERMANENT TABLES AND FIELDS COMPRISING OUR PRODUCTION DATABASE ARE GIVEN IN APPENDIX 1. DATA ARE INSERTED INTO THE DATABASE EITHER MANUALLY OR THROUGH A QUASI-AUTOMATIC PROCESS WHERE DATA STATIONS OUTPUT RESULTS OF THEIR MEASUREMENTS TO STRUCTURED TEXT FILES [SEE “UM DAQ SYSTEM FOR MDT PRODUCTION” BY QICHUN AND ZHOU, SUBMITTED AS AN ATLAS NOTE]. THESE TEXT FILES ARE THEN LOADED INTO THE DATABASE THROUGH EXPRESS ACTIONS OF THE DATABASE MANAGER (OR A MONITORING PACKAGE, WHICH HE OR SHE CONTROLS). IN THE LATTER STEP ONE HAS THE OPTION OF NOT ONLY THE LIST OF PERMANENT TABLES AND FIELDS COMPRISING OUR PRODUCTION DATABASE ARE GIVEN IN APPENDIX 1. DATA ARE INSERTED INTO THE DATABASE EITHER MANUALLY OR THROUGH A QUASI-AUTOMATIC PROCESS WHERE DATA STATIONS OUTPUT RESULTS OF THEIR MEASUREMENTS TO STRUCTURED TEXT FILES [SEE “UM DAQ SYSTEM FOR MDT PRODUCTION” BY QICHUN AND ZHOU, SUBMITTED AS AN ATLAS NOTE]. THESE TEXT FILES ARE THEN LOADED INTO THE DATABASE THROUGH EXPRESS ACTIONS OF THE DATABASE MANAGER (OR A MONITORING PACKAGE, WHICH HE OR SHE CONTROLS). IN THE LATTER STEP ONE HAS THE OPTION OF NOT ONLY COORDINATING THE DAILY UPDATES, BUT OF ALSO EXECUTING CERTAIN CONSISTENCY CHECKS BEFORE THE UPLOADING TAKES PLACE.

Figure 1 : Schematic for information flow from each test station, to the File Server and finally into the Certification DB

6.2 WEB INTERFACE

GIVEN THE DISTRIBUTED NATURE OF OUR PRODUCTION AND TESTING FACILITY, AS WELL AS THE FACT THAT KEY INDIVIDUALS IN OUR GROUP MUST BE ABLE TO QUERY THE STATUS OF THE FABRICATION AT ANY TIME AND FROM ANY PLACE IN THE WORLD, WE HAVE GIVEN HIGH PRIORITY TO PROVIDING FULL DATABASE ACCESS AND CONTROL TO AUTHENTICATED USERS VIA THE WEB.

THE ENTIRE INTERFACE WITH THE DATABASE WILL, OF COURSE, APPEAR DIFFERENTLY FROM THE DIRECT HOST-BASED INTERFACE DESCRIBED HERE. ONE REASON HAS TO DO WITH SECURITY CONSIDERATIONS. ANOTHER TECHNICAL REASON IS THAT THE WEB USER IS REALLY NOT RUNNING ACCESS ON THE HOST MACHINE, BUT RATHER IS BEING PROVIDED WITH VARIOUS PUBLISHED SERVICES. WE HAVE PROVIDED MORE DETAILS ABOUT HOW THE FEATURES OF THE WEB INTERFACE IN A PREVIOUS ATLAS NOTE ON OUR PRODUCTION DATABASE (SEE REFERENCE 1)).

7. PLANNED FUTURE EXPLORATIONS

WE PLAN TO SUPPORT FUTURE DEVELOPMENT BASED UPON FEEDBACK FROM CHAMBER COMMISSIONERS.

8. FIGURES

Following are the figures referenced in the paper. First are the component ID drawings

Figure 2: Local chamber construction coordinate definition

Figure 3 : EI/EM chamber numbering scheme