1. An Outline of Data Analysis for the 2002 H8 Test Beam
  2. Analysis Benchmarks/Goals
  3. Dead/Noisy Channels
  4. Electronics Problems
  5. 2 Dead Layers
  6. A Typical TDC Spectrum
  7. Two Types of Bad Channels
  8. Runs with Current Scan
  9. Overall Statistics
  10. Overall Statistics
  11. Overall Statistics
  12. T-Zero Data for US Chambers
  13. T-Zero Variation over Time
  14. Drift Time Variation
  15. Mean Drift Time for EIL2 Chamber
  16. Mean Drift Time for EML2 Chamber
  17. Mean Drift Time for EOL Chamber
  18. Slide 18
  19. Conclusions

An Outline of Data Analysis for the 2002 H8 Test Beam

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Analysis Benchmarks/Goals

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Dead/Noisy Channels

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Electronics Problems

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2 Dead Layers

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A Typical TDC Spectrum

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Two Types of Bad Channels

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Runs with Current Scan

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Overall Statistics

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Overall Statistics

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Overall Statistics

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T-Zero Data for US Chambers

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T-Zero Variation over Time

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Drift Time Variation

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Mean Drift Time for EIL2 Chamber

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Mean Drift Time for EML2 Chamber

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Mean Drift Time for EOL Chamber

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Slide 18

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Conclusions

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